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New transmission electron microscope FEI Titan 80-300 Cubed

The FEI Titan³ 80-300 reaches a lateral resolution of better than 0.1nm. Chemical composition and electronic properties can be examined by energy dispersive x-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS) on sub-nanometer scale. The microscope is additionally equipped with a Möllenstedt Biprisma for electron holography and a sample holder for electron tomography, to reconstruct the sample morphology in three dimensions.