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The dominant experimental technique in our reasearch is transmission electron microscopy (TEM) which provides information from the micrometer down to the atomic scale. The investigation of the microstructure is supplemented by chemical analysis techniques in the electron microscope like EDXS (energy dispersive X-ray spectroscopy), EELS (electron-energy loss spectroscopy) and ESI (electron spectroscopic imaging), which can be carrried out at a high spatial resolution in the order of a few nanometers. Information about the surface morphology is obtained by scanning electron microscopy (SEM). The investigation of the structural properties is often combined with alternative characterization techniques in collaboration with other groups to obtain correlations between the optical, mechanical or electronic properties and the structural properties.
The following research projects in the areas of solid state physics, materials science, nanotechnology and methodology as well as developments of image evaluation techniques for the transmission electron microscopy are currently under way:


Fields of research


Methodological developments