Dr. Martin Peterlechner (Director Transmission Electron Microscopy)
Tel.. 0721 608-43719 (martin peterlechner∂kit edu)
Electron emitter
Schottky FEG
80 kV, 300 kV
STEM imaging: Fischione Model 3000 ADF detector, Gatan BF/DF detector
EDXS: EDAX Si(Li) detector with Moxtek AP 3.3 window
STEM Unit with bright-field, dark-field and high-angle annular dark-field (HAADF) detector (resolution down to 0.14 nm (at 300 kV))
CEOS Cetcor image-side spherical aberration corrector)
Wien type monochromator
TVIPS XF416(R) on-axis CMOS camera (4k x 4k)
US1000 (2kx2k) at Gatan Tridiem GIF
Lense and aperture
Flexible condenser lens system (3 lenses) allows for tuneable convergence angle or Köhler illumination
10 µm C2 aperture allowing a convergence angle down to ~0.12 mrad with a probe size of a few nm in µP STEM mode
0,08 nm (TEM)
0,14 nm (STEM)
Imaging /
Spectroscopic methods
Energy-dispersive X-ray spectroscopy (EDXS)
Electron energy loss spectroscopy (EELS) with Gatan Imaging Filter (GIF) Tridiem 865 HR with Gatan Ultrascan1000 (2k x 2k), energy resolution 0,2 eV and energy filtered imaging (ESI)
Möllenstedt biprism for off-axis electron holography
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