KIT - Karlsruhe Institute of Technology
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Laboratory for Electron Microscopy
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Cluster 3DMM2O
Solar cells
Solid oxide fuel cells
Superconducting Thin Films
Multiferroelectrica
Creep-induced microstructural evolution of the eutectic Mo-Si-Ti alloy
Characterization of Materials Compounds from Composite Materials
Segregation to creep-induced planar faults in Ni-base SX superalloys
Novel Materials: Metal-Organic Frameworks
A Nuisance for Every Microscopist: Carbon Contamination
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Oxygen separation membranes
Nanoparticles and clusters
Nanoparticles in biological cells
Diamond-like Carbon
TEM with physical phase plates
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Electron microscopy I
Electron microscopy II
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Electron microscopy II
Electron microscopy II
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Scanning electron microscopy
Transmission electron microscopy
Focused-Ion-Beam (FIB) microscopy
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TEM
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TEM
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FEI Titan³
FEI Tecnai Osiris
Philips CM 200
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FIB
FEI Helios G4
FEI Strata 400S
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Zeiss LEO 1530 Gemini
FEI Quanta FEG 650
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Sample Preparation
Sample Preparation
Leica EM ACE600
Gatan PIPS II
Struers TenuPol-5
Leica EM UC6 Ultramicrotome
Carbolite Gero Split Tube Furnace
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MNM Junior Research Group
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Tobias Hauth
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Bldg. 30.22, R. 228
phone:
+49 721 608 - 4 3200
fax:
+49 721 608 - 4 3721
tobias hauth
∂
does-not-exist.
kit edu
